SEM (Scanning Electron Microscope) Laboratory

Brand / Model: FEI / Quanta 450 FEG

Quanta Scanning Electron microscopes allow for the widest range of SEM applications for samples with FEG electron-induced and three imaging modes (high vacuum, low vacuum, ESEM). Quanta 450 SEM systems are equipped with analytical systems such as Energy Dispersion Spectrometer (EDS), Wavelength Dispersion Spectrometer (WDS) and Backscattered Electron Diffraction (EBSD). In addition, Field Emission Gun (FEG) systems can perform bright field (BF) and dark field (DF) sample imaging with the S / TEM detector.

Technical specifications

Voltage Range: 200 V- 30 kV

Probe Current: ≤ 200 nA

Magnification: 6 - 1000000 x

45o Objective Lens Construction

6144 x 4096 Pixel Display

Digital Video Recording

EDS Feature

High Resolution Schottky Field Emission

Sample Features:

Samples with unsuitable size are adjusted with a minitom (cutting) device with an aluminum and diamond-tipped knife.

With the molding device (sample holder), small samples that will have difficulty in polishing process or mounting to the microscope are molded to fit both the automatic polishing disc and easier assembly.

With the polishing device, the surfaces of the samples to be analyzed can be polished to the order of 1 mm and a smoother surface can be obtained.

With the sputtering device, non-conductive samples are covered with a conductive layer (C, Au-Pd).

With the critical point drier device, the biological samples are made to be examined in SEM without damaging the shape and structure and drying.

Scope of application

Surface characterization of materials such as metals, compounds, ceramics, composites, films, geological parts, polymers, tissues, plant materials, drugs, particles, fibers can be made.